Analysis device for compositions and alloys, which can produce fast and precise elemental analysis without the aid of auxiliary gas, or vacuum X-ray. Due to the XRF-method the surface preparation of the samples is mostly not necessary, and is only minimally required with the most polluted cases. The device can be easily used even on a surface of a 5 Ft coin, thus it is capable for the examination of weldments, cables or other small-sized samples. With the newly developed silicium drift detector (SDD)detection of  light metals (Ti, Al, Mg, Si) is also possible without vacuum and auxiliary gases.